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The Inspection Algorithm using Invariant Moment for the Detection of Lead Faults of Semiconductor IC
Rhee Kil Whi, Kim Joon Seek The Transactions of the Korea Information Processing Society (1994 ~ 2000),
Vol. 5, No. 10, pp. 2737-2749,
Oct.
1998
10.3745/KIPSTE.1998.5.10.2737
10.3745/KIPSTE.1998.5.10.2737
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